42,311 research outputs found

    Two-stage hybrid feature selection algorithms for diagnosing erythemato-squamous diseases

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    This paper proposes two-stage hybrid feature selection algorithms to build the stable and efficient diagnostic models where a new accuracy measure is introduced to assess the models. The two-stage hybrid algorithms adopt Support Vector Machines (SVM) as a classification tool, and the extended Sequential Forward Search (SFS), Sequential Forward Floating Search (SFFS), and Sequential Backward Floating Search (SBFS), respectively, as search strategies, and the generalized F-score (GF) to evaluate the importance of each feature. The new accuracy measure is used as the criterion to evaluated the performance of a temporary SVM to direct the feature selection algorithms. These hybrid methods combine the advantages of filters and wrappers to select the optimal feature subset from the original feature set to build the stable and efficient classifiers. To get the stable, statistical and optimal classifiers, we conduct 10-fold cross validation experiments in the first stage; then we merge the 10 selected feature subsets of the 10-cross validation experiments, respectively, as the new full feature set to do feature selection in the second stage for each algorithm. We repeat the each hybrid feature selection algorithm in the second stage on the one fold that has got the best result in the first stage. Experimental results show that our proposed two-stage hybrid feature selection algorithms can construct efficient diagnostic models which have got better accuracy than that built by the corresponding hybrid feature selection algorithms without the second stage feature selection procedures. Furthermore our methods have got better classification accuracy when compared with the available algorithms for diagnosing erythemato-squamous diseases

    Extending twin support vector machine classifier for multi-category classification problems

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    © 2013 – IOS Press and the authors. All rights reservedTwin support vector machine classifier (TWSVM) was proposed by Jayadeva et al., which was used for binary classification problems. TWSVM not only overcomes the difficulties in handling the problem of exemplar unbalance in binary classification problems, but also it is four times faster in training a classifier than classical support vector machines. This paper proposes one-versus-all twin support vector machine classifiers (OVA-TWSVM) for multi-category classification problems by utilizing the strengths of TWSVM. OVA-TWSVM extends TWSVM to solve k-category classification problems by developing k TWSVM where in the ith TWSVM, we only solve the Quadratic Programming Problems (QPPs) for the ith class, and get the ith nonparallel hyperplane corresponding to the ith class data. OVA-TWSVM uses the well known one-versus-all (OVA) approach to construct a corresponding twin support vector machine classifier. We analyze the efficiency of the OVA-TWSVM theoretically, and perform experiments to test its efficiency on both synthetic data sets and several benchmark data sets from the UCI machine learning repository. Both the theoretical analysis and experimental results demonstrate that OVA-TWSVM can outperform the traditional OVA-SVMs classifier. Further experimental comparisons with other multiclass classifiers demonstrated that comparable performance could be achieved.This work is supported in part by the grant of the Fundamental Research Funds for the Central Universities of GK201102007 in PR China, and is also supported by Natural Science Basis Research Plan in Shaanxi Province of China (Program No.2010JM3004), and is at the same time supported by Chinese Academy of Sciences under the Innovative Group Overseas Partnership Grant as well as Natural Science Foundation of China Major International Joint Research Project (NO.71110107026)

    High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes

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    We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of ≈25  nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube
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